Spectroscopy vs. electrochemistry: catalyst layer thickness effects on operando/in situ measurements
Diercks JS, Herranz J, Ebner K, Diklić N, Georgi M, Chauhan P, Clark AH, Nachtegaal M, Eychmüller A & Schmidt TJ
Diercks, J. S., Herranz, J., Ebner, K., Diklić, N., Georgi, M., Chauhan, P., … Schmidt, T. J. (2023). Spectroscopy vs. electrochemistry: catalyst layer thickness effects on operando/in situ measurements. Angewandte Chemie International Edition, 62(16), e202216633 (7 pp.). https://doi.org/10.1002/anie.202216633