7 nm spatial resolution in soft X-ray microscopy

Rösner B, Koch F, Döring F, Guzenko VA, Meyer M, Ornelas JL, Späth A, Fink RH, Stanescu S, Swaraj S, Belkhou R, Watts B, Raabe J & David C
Choose the citation style.
Rösner, B., Koch, F., Döring, F., Guzenko, V. A., Meyer, M., Ornelas, J. L., … David, C. (2018). 7 nm spatial resolution in soft X-ray microscopy. Microscopy and Microanalysis, 24(Suppl. 2), 270-271. https://doi.org/10.1017/S1431927618013697
https://www.dora.lib4ri.ch/psi/islandora/object/psi:5323
Details
Publication Type

Journal Article

Title

7 nm spatial resolution in soft X-ray microscopy

Author(s)

Rösner, Benedikt (6212 X-ray Optics and Applications)

Koch, Frieder (6212 X-ray Optics and Applications)

Döring, Florian (6212 X-ray Optics and Applications)

Guzenko, Vitaliy A. (6212 X-ray Optics and Applications)

Meyer, Markus

Ornelas, Joshua L.

Späth, Andreas

Fink, Rainer H.

Stanescu, Stefan

Swaraj, Sufal

Belkhou, Rachid

Watts, Benjamin (6315 Microspectroscopy)

Raabe, Jörg (6315 Microspectroscopy)

David, Christian (6212 X-ray Optics and Applications)

Journal

Microscopy and Microanalysis

Volume

24

Issue

Suppl. 2

Start Page

270

End Page

271

Publication Year

2018

Peer Review

Yes

Facility

SLS
non-PSI large scale facility (e.g. ESRF, ILL, etc.)

Beamline

PolLux

Funding (EC, SNSF)

European Commission: PSI-FELLOW-II-3i - International, Interdisciplinary and Intersectoral Postdocs (701647)

Collection

PSI Publications
Open Access

Additional Information

Volume 24, Supplement S2 (Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018)) #green This article is made freely available with permission of the rights holder based on a Swiss National License.