In-operando soft X-ray microspectroscopy of organic electronics devices

Fink RH, Rösner B, Du X, Späth A, Johnson M, Hawly T, Watts B, Raabe J, Gregoratti L & Amati M
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Fink, R. H., Rösner, B., Du, X., Späth, A., Johnson, M., Hawly, T., … Amati, M. (2018). In-operando soft X-ray microspectroscopy of organic electronics devices. Microscopy and Microanalysis, 24(Suppl. 2), 424-425. https://doi.org/10.1017/S143192761801437X
https://www.dora.lib4ri.ch/psi/islandora/object/psi:5325
Details
Publication Type

Journal Article

Title

In-operando soft X-ray microspectroscopy of organic electronics devices

Author(s)

Fink, Rainer H.

Rösner, Benedikt (6212 X-ray Optics and Applications)

Du, Xiaoyan

Späth, Andreas

Johnson, Manuel

Hawly, Tim

Watts, Benjamin (6315 Microspectroscopy)

Raabe, Jörg (6315 Microspectroscopy)

Gregoratti, Luca

Amati, Matteo

Journal

Microscopy and Microanalysis

Volume

24

Issue

Suppl. 2

Start Page

424

End Page

425

Publication Year

2018

Peer Review

Yes

Facility

SLS
non-PSI large scale facility (e.g. ESRF, ILL, etc.)

Beamline

PolLux
NanoXAS

Collection

PSI Publications
Open Access

Additional Information

#present_address: Rösner #green This article is made freely available with permission of the rights holder based on a Swiss National License.