High-resolution 3D scanning X-ray microscopes at the Swiss Light Source
Holler, M., Raabe, J., Diaz, A., Guizar-Sicairos, M., Tsai, E. H. R., Odstrcil, M., … Bunk, O. (2018). High-resolution 3D scanning X-ray microscopes at the Swiss Light Source. Microscopy and Microanalysis, 24(Suppl. 2), 168-170. https://doi.org/10.1017/S1431927618013223