SwissFEL KB-optics at-wavelength wavefront characterisation

Krempaský, J.; Vonka, J.; Pedrini, B.; Steppke, A.; Flechsig, U.; Follath, R.; Rösner, B.; Wagner, U.H.; David, C.; Makita, M.; Vagovič, P.

doi:10.1117/12.2665587

SwissFEL KB-optics at-wavelength wavefront characterisation

Krempaský J, Vonka J, Pedrini B, Steppke A, Flechsig U, Follath R, Rösner B, Wagner UH, David C, Makita M & Vagovič P

Citation

Krempaský, J., Vonka, J., Pedrini, B., Steppke, A., Flechsig, U., Follath, R., … Vagovič, P. (2023). SwissFEL KB-optics at-wavelength wavefront characterisation. In T. Tschentscher, L. Patthey, K. Tiedtke, & M. Zangrando (Eds.), Proceedings of SPIE: Vol. 12581. Proceedings of X-Ray free-electron lasers: advances in source development and instrumentation VI (p. 125810A (8 pp.). https://doi.org/10.1117/12.2665587

Persistent URL https://www.dora.lib4ri.ch/psi/islandora/object/psi:54929

Steering x-ray beams from the source towards the experiment without distorting their wavefront defines extraordinary high-quality requirements on the production of the x-ray optics. We report on how this demand settled with in situ shot-to-shot wavefront sensing optimization of KB optics at SwissFEL beamlines. This contribution presents methodology that combines moir'e interferometry and single-phase-grating Talbot interferometry. We discuss an online Kirkpatrick-Baez (KB) test plan at the Cristallina beamline based on single phase grating Talbot interferometry, demonstrating progressive optimization steps in minimizing KB wavefront distortion.

Details

Publication Type

Proceedings Paper

Title

SwissFEL KB-optics at-wavelength wavefront characterisation

Author(s)

Krempaský, J. (6613 Beamline Optics)

Vonka, J. (6218 Quantum Photon Science)

Pedrini, B. (6218 Quantum Photon Science)

Steppke, A. (6218 Quantum Photon Science)

Flechsig, U. (6613 Beamline Optics)

Follath, R. (6613 Beamline Optics)