Enhancing spatial resolution in MÖNCH for electron microscopy via deep learning

Xie X, Barba Flores L, Bejar Haro B, Bergamaschi A, Fröjdh E, Müller E, Paton KA, Poghosyan E & Remlinger C
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Xie, X., Barba Flores, L., Bejar Haro, B., Bergamaschi, A., Fröjdh, E., Müller, E., … Remlinger, C. (2024). Enhancing spatial resolution in MÖNCH for electron microscopy via deep learning. Journal of Instrumentation, 19(01), C01020 (11 pp.). https://doi.org/10.1088/1748-0221/19/01/C01020