Surface x-ray diffraction of complex metal oxide surfaces and interfaces - a new era

Schlepütz, C.M.; Willmott, P.R.; Pauli, S.A.; Herger, R.; Martoccia, D.; Björck, M.; Kumah, D.; Clarke, R.; Yacoby, Y.

doi:10.1063/1.3086245

Surface x-ray diffraction of complex metal oxide surfaces and interfaces - a new era

Schlepütz CM, Willmott PR, Pauli SA, Herger R, Martoccia D, Björck M, Kumah D, Clarke R & Yacoby Y

Citation

Schlepütz, C. M., Willmott, P. R., Pauli, S. A., Herger, R., Martoccia, D., Björck, M., … Yacoby, Y. (2009). Surface x-ray diffraction of complex metal oxide surfaces and interfaces - a new era. In R. Magalhaes-Paniago (Ed.), AIP conference proceedings: Vol. 1092. Proceedings of the 6th international conference on synchrotron radiation in materials science (pp. 9-12). https://doi.org/10.1063/1.3086245

Persistent URL https://www.dora.lib4ri.ch/psi/islandora/object/psi:62664

The availability of high-brilliance hard x-ray synchrotron radiation and the advent of novel photon counting area detectors have brought surface x-ray diffraction (SXRD) into a new era. It is now possible to record large numbers of structure factors with much improved reliability within reasonable beamtime durations. As a result, structural determination of the surfaces and interfaces of complex crystallographic systems and heterostructures has now become feasible, especially in conjunction with phase-retrieval methods. It is thereby hoped that detailed structural information will shed light on the unusual physical properties of these systems. Complex metal oxide systems investigated at the Materials Science beamline of the Swiss Light Source, including the surface of SrTiO₃, the interface between LaA1O₃ and SrTiO₃, and the structure of YBa₂Cu₃O₇ grown on NdGaO₃, SrTiO₃, and (LaSr)(AlTa)O₃ will be presented as examples of what is now possible using SXRD.