Improved spatial resolution for reflection mode infrared spectromicroscopy
Bechtel HA, Martin MC, May TE & Lerch P
Bechtel, H. A., Martin, M. C., May, T. E., & Lerch, P. (2010). Improved spatial resolution for reflection mode infrared spectromicroscopy. In AIP conference proceedings: Vol. 1214. 5th international workshop on infrared microscopy and spectroscopy with accelerator based sources (pp. 51-53). https://doi.org/10.1063/1.3326347