Transition metal oxides (TMOs) exhibit a broad spectrum of functional electronic, magnetic, and optical properties, making them attractive for various technological applications. The scale and impact of surface defects and inhomogeneity can extend many unit cells below the surface. Overlooking this aspect of TMO surfaces can result in an incorrect interpretation of their physics and inhibit their maturation into device technology. Soft x-ray absorption spectroscopy (XAS) is a common technique for TMO studies, and different XAS acquisition modes can be used to measure different depth regimes in the sample. Here, we demonstrate a substantial disparity between the near-surface region and the “bulk” of the prototypical TMO SrVO₃. By driving the system across two scenarios of orbital polarization, we illustrate how a common XAS surface-sensitive acquisition technique fails to detect the intrinsic orbital polarization. By stark contrast, a “bulk”-sensitive technique successfully captures this effect, elucidating the expected orbital occupation inversion. These results not only underscore the impact of the near-surface region on the correct interpretation of TMO fundamental physics, but further highlight the scale of surface inhomogeneity, a critical aspect of nanoscale functional devices.