In this study, we propose a new method for single-shot, high-resolution lensless imaging called double-slit holography. This technique combines the properties of in-line and off-axis holography in one single-shot measurement using the simplest double-slit device: a plate with two apertures. In double-slit holography, a plane wave illuminates the two apertures giving rise to two spherical waves. While diffraction of one spherical wave from a sample positioned behind the first aperture (the object aperture) provides the object wave, the other spherical wave diffracted from the second (reference) aperture provides the reference wave. The resulting interference pattern in the far-field (hologram) combines the properties of an in-line (or Gabor-type) hologram and an off-axis hologram due to the added reference wave from the second aperture. Both the object and reference waves have the same intensity, which ensures high contrast of the hologram. Due to the off-axis scheme, the amplitude and phase distributions of the sample can be directly reconstructed from the hologram, and the twin image can be easily separated. Due to the object wave being the same as in-line holography with a spherical wave, imaging at different magnifications is similarly done by simply adjusting the aperture-to-sample distance. The resolution of the reconstructed object is given by the numerical aperture of the optical setup and the diameter of the reference aperture. It is shown both by theory and simulations that the resolution of the reconstructed object depends on the diameter of the reference wave aperture but does not depend on the diameter of the object aperture. Light optical proof-of-concept experiments are provided. The proposed method can be particularly practical for X-rays, where optical elements such as beam splitters are not available and conventional off-axis holography schemes cannot be realised.