Robust dark-field signal extraction for modulation-based x-ray tensor tomography

Lautizi G, Di Trapani V, Studer A, Zdora M-C, De Marco F, Kim J, Marone F, Stampanoni M & Thibault P
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Lautizi, G., Di Trapani, V., Studer, A., Zdora, M. C., De Marco, F., Kim, J., … Thibault, P. (2024). Robust dark-field signal extraction for modulation-based x-ray tensor tomography. Applied Physics Letters, 125(26), 264103 (5 pp.). https://doi.org/10.1063/5.0244120
https://www.dora.lib4ri.ch/psi/islandora/object/psi:68039

We demonstrate a robust signal extraction method for x-ray speckle-based tensor tomography. We validate the effectiveness of the method for several carbon fiber composites, highlighting its potential for industrial applications. The proposed method can be adapted to various acquisition schemes and wavefront-marking optical elements, making it a versatile and robust tool for x-ray scattering tensor tomography.

Details
Publication Type

Journal Article

Title

Robust dark-field signal extraction for modulation-based x-ray tensor tomography

Author(s)

Lautizi, Ginevra

Di Trapani, Vittorio

Studer, Alain (7902 Data Processing Development and Consulting)

Zdora, Marie-Christine

De Marco, Fabio

Kim, Jisoo

Marone, Federica (6111 X-ray Tomography)

Stampanoni, Marco (6111 X-ray Tomography)

Thibault, Pierre

Journal

Applied Physics Letters

Volume

125

Issue

26

Start Page

264103 (5 pp.)

Publication Year

2024

Peer Review

Yes

Funding (EC, SNSF)

European Commission: S-BaXIT - Scattering-Based X-ray Imaging and Tomography (866026)

Collection

PSI Publications
Open Access

Additional Information

#hybrid