Fast and precise measurement in the sub-20nm size range using a Scanning Mobility Particle Sizer

Tröstl J, Tritscher T, Bischof OF, Horn H-G, Krinke T, Baltensperger U & Gysel M
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Tröstl, J., Tritscher, T., Bischof, O. F., Horn, H. G., Krinke, T., Baltensperger, U., & Gysel, M. (2015). Fast and precise measurement in the sub-20nm size range using a Scanning Mobility Particle Sizer. Journal of Aerosol Science, 87, 75-87. https://doi.org/10.1016/j.jaerosci.2015.04.001