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  • (-) PSI Laboratories = Condensed Matter LSC
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Hessian splines for scanning transmission X-ray microscopy
Debarre, T., Watts, B., Rösner, B., & Unser, M. (2020). Hessian splines for scanning transmission X-ray microscopy. In IEEE international symposium on biomedical imaging. 2020 IEEE 17th international symposium on biomedical imaging (ISBI) proceedings (pp. 199-202). https://doi.org/10.1109/ISBI45749.2020.9098539
Soft x-ray microscopy with 7 nm resolution
Rösner, B., Finizio, S., Koch, F., Döring, F., Guzenko, V. A., Langer, M., … David, C. (2020). Soft x-ray microscopy with 7 nm resolution. Optica, 7(11), 1602-1608. https://doi.org/10.1364/OPTICA.399885
Diffractive X-ray optics for synchrotrons and free-electron lasers
David, C., Rösner, B., Döring, F., Guzenko, V., Koch, F., Lebugle, M., … Schroer, C. (2018). Diffractive X-ray optics for synchrotrons and free-electron lasers. Microscopy and Microanalysis, 24(Suppl. 2), 264-267. https://doi.org/10.1017/S1431927618013673
Changes in the near edge x-ray absorption fine structure of hybrid organic-inorganic resists upon exposure
Fallica, R., Watts, B., Rösner, B., Della Giustina, G., Brigo, L., Brusatin, G., & Ekinci, Y. (2018). Changes in the near edge x-ray absorption fine structure of hybrid organic-inorganic resists upon exposure. Nanotechnology, 29(36), 36LT03 (6 pp.). https://doi.org/10.1088/1361-6528/aaccd4
In-operando soft X-ray microspectroscopy of organic electronics devices
Fink, R. H., Rösner, B., Du, X., Späth, A., Johnson, M., Hawly, T., … Amati, M. (2018). In-operando soft X-ray microspectroscopy of organic electronics devices. Microscopy and Microanalysis, 24(Suppl. 2), 424-425. https://doi.org/10.1017/S143192761801437X
7 nm spatial resolution in soft X-ray microscopy
Rösner, B., Koch, F., Döring, F., Guzenko, V. A., Meyer, M., Ornelas, J. L., … David, C. (2018). 7 nm spatial resolution in soft X-ray microscopy. Microscopy and Microanalysis, 24(Suppl. 2), 270-271. https://doi.org/10.1017/S1431927618013697
Exploiting atomic layer deposition for fabricating sub-10 nm X-ray lenses
Rösner, B., Koch, F., Döring, F., Bosgra, J., Guzenko, V. A., Kirk, E., … David, C. (2018). Exploiting atomic layer deposition for fabricating sub-10 nm X-ray lenses. Microelectronic Engineering, 191, 91-96. https://doi.org/10.1016/j.mee.2018.01.033