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The hard X-ray Photon Single-Shot Spectrometer of SwissFEL - Initial characterization
Rehanek, J., Makita, M., Wiegand, P., Heimgartner, P., Pradervand, C., Seniutinas, G., … Juranić, P. (2017). The hard X-ray Photon Single-Shot Spectrometer of SwissFEL - Initial characterization. Journal of Instrumentation, 12(5), P05024 (13 pp.). https://doi.org/10.1088/1748-0221/12/05/P05024
The Materials Science beamline upgrade at the Swiss Light Source
Willmott, P. R., Meister, D., Leake, S. J., Lange, M., Bergamaschi, A., Böge, M., … Wullschleger, R. (2013). The Materials Science beamline upgrade at the Swiss Light Source. Journal of Synchrotron Radiation, 20(5), 667-682. https://doi.org/10.1107/S0909049513018475
Five-element Johann-type x-ray emission spectrometer with a single-photon-counting pixel detector
Kleymenov, E., van Bokhoven, J. A., David, C., Glatzel, P., Janousch, M., Alonso-Mori, R., … Nachtegaal, M. (2011). Five-element Johann-type x-ray emission spectrometer with a single-photon-counting pixel detector. Review of Scientific Instruments, 82(6), 065107 (7 pp.). https://doi.org/10.1063/1.3600452