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  • (-) PSI Authors = Lopez Cuenca, Carlos
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Quantum efficiency measurement and modeling of silicon sensors optimized for soft X-ray detection
Carulla, M., Barten, R., Baruffaldi, F., Bergamaschi, A., Borghi, G., Boscardin, M., … Zhang, J. (2024). Quantum efficiency measurement and modeling of silicon sensors optimized for soft X-ray detection. Sensors, 24(3), 942 (19 pp.). https://doi.org/10.3390/s24030942
Characterization of iLGADs using soft X-rays
Liguori, A., Barten, R., Baruffaldi, F., Bergamaschi, A., Borghi, G., Boscardin, M., … Zhang, J. (2023). Characterization of iLGADs using soft X-rays. Journal of Instrumentation, 18(12), P12006 (15 pp.). https://doi.org/10.1088/1748-0221/18/12/P12006
Towards MYTHEN III - prototype characterisation of MYTHEN III.0.2
Andrä, M., Barten, R., Bergamaschi, A., Brückner, M., Casati, N., Cervellino, A., … Zhang, J. (2019). Towards MYTHEN III - prototype characterisation of MYTHEN III.0.2. Journal of Instrumentation, 14(11), C11028 (8 pp.). https://doi.org/10.1088/1748-0221/14/11/C11028
The MÖNCH detector for soft X-ray, high-resolution, and energy resolved applications
Bergamaschi, A., Andrä, M., Barten, R., Borca, C., Brückner, M., Chiriotti, S., … Zhang, J. (2018). The MÖNCH detector for soft X-ray, high-resolution, and energy resolved applications. Synchrotron Radiation News, 31(6), 11-15. https://doi.org/10.1080/08940886.2018.1528428
SwissFEL: the Swiss X-ray free electron laser
Milne, C. J., Schietinger, T., Aiba, M., Alarcon, A., Alex, J., Anghel, A., … Braun, H. H. (2017). SwissFEL: the Swiss X-ray free electron laser. Applied Sciences, 7(7), 720 (57 pp.). https://doi.org/10.3390/app7070720
The EIGER detector for low-energy electron microscopy and photoemission electron microscopy
Tinti, G., Marchetto, H., Vaz, C. A. F., Kleibert, A., Andrä, M., Barten, R., … Zhang, J. (2017). The EIGER detector for low-energy electron microscopy and photoemission electron microscopy. Journal of Synchrotron Radiation, 24(5), 963-974. https://doi.org/10.1107/S1600577517009109