Active Filters

  • (-) PSI Authors = Camarda, Massimo C.
  • (-) Journals = Physical Review Materials
Search Results 1 - 1 of 1
  • RSS Feed
Select Page
Two-dimensional defect mapping of the SiO<sub>2</sub>/4<em>H</em>−SiC interface
Woerle, J., Johnson, B. C., Bongiorno, C., Yamasue, K., Ferro, G., Dutta, D., … Camarda, M. (2019). Two-dimensional defect mapping of the SiO2/4H−SiC interface. Physical Review Materials, 3(8), 084602 (8 pp.). https://doi.org/10.1103/PhysRevMaterials.3.084602