Woerle, J., Johnson, B. C., Bongiorno, C., Yamasue, K., Ferro, G., Dutta, D., … Camarda, M. (2019). Two-dimensional defect mapping of the SiO2/4H−SiC interface. Physical Review Materials, 3(8), 084602 (8 pp.). https://doi.org/10.1103/PhysRevMaterials.3.084602