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X-ray grating interferometry - applications in metrology and wave front sensing
David, C., Rutishauser, S., Sprung, M., Zanette, I., & Weitkamp, T. (2012). X-ray grating interferometry - applications in metrology and wave front sensing. In A. Momose & W. Yashiro (Eds.), AIP conference proceedings: Vol. 1466. International workshop on x-ray and neutron phase imaging with gratings (pp. 23-28). https://doi.org/10.1063/1.4742264