Kumar, P., Martins, M. I. M., Bathen, M. E., Woerle, J., Prokscha, T., & Grossner, U. (2022). Depth-resolved study of the SiO2-SiC interface using low-energy muon spin rotation spectroscopy. In J. F. Michaud, L. V. Phung, D. Alquier, & D. Planson (Eds.), Materials science forum: Vol. 1062. Silicon carbide and related materials 2021 (pp. 315-319). https://doi.org/10.4028/p-w73601