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Neutron reflectometry for the investigation of self-diffusion in amorphous silicon
Strauß, F., Geue, T., Stahn, J., & Schmidt, H. (2015). Neutron reflectometry for the investigation of self-diffusion in amorphous silicon. Defect and Diffusion Forum, 363, 225-230. https://doi.org/10.4028/www.scientific.net/DDF.363.225
A neutron reflectometry study on silicon self-diffusion at 900°C
Hüger, E., Kube, R., Bracht, H., Stahn, J., Geue, T., & Schmidt, H. (2012). A neutron reflectometry study on silicon self-diffusion at 900°C. Physica Status Solidi B: Basic Research, 249(11), 2108-2112. https://doi.org/10.1002/pssb.201248330
Self-diffusion in magnetron-sputtered nanocrystalline Fe films
Chakravarty, S., Tietze, U., Lott, D., Horisberger, M., Stahn, J., Lalla, N. P., & Schmidt, H. (2010). Self-diffusion in magnetron-sputtered nanocrystalline Fe films. Journal of Nano Research, 11, 13-18. https://doi.org/10.4028/www.scientific.net/JNanoR.11.13
Diffusion in isotope heterostructures investigated by neutron reflectometry
Hüger, E., Stahn, J., Geckle, U., Bruns, M., & Schmidt, H. (2009). Diffusion in isotope heterostructures investigated by neutron reflectometry. Defect and Diffusion Forum, 289-292, 697-703. https://doi.org/10.4028/www.scientific.net/DDF.289-292.697