Active Filters

  • (-) PSI Groups = 3304 Applied Materials
  • (-) PSI Laboratories = Micro- and Nanotechnology LMN
Search Results 1 - 5 of 5
  • RSS Feed
Select Page
Light yield enhancement of 157-gadolinium oxysulfide scintillator screens for the high-resolution neutron imaging
Crha, J., Vila-Comamala, J., Lehmann, E., David, C., & Trtik, P. (2019). Light yield enhancement of 157-gadolinium oxysulfide scintillator screens for the high-resolution neutron imaging. MethodsX, 6, 107-114. https://doi.org/10.1016/j.mex.2018.12.005
Clogging in staked-in needle pre-filled syringes (SIN-PFS): influence of water vapor transmission through the needle shield
De Bardi, M., Müller, R., Grünzweig, C., Mannes, D., Rigollet, M., Bamberg, F., … Yang, K. (2018). Clogging in staked-in needle pre-filled syringes (SIN-PFS): influence of water vapor transmission through the needle shield. European Journal of Pharmaceutics and Biopharmaceutics, 127, 104-111. https://doi.org/10.1016/j.ejpb.2018.02.016
On the needle clogging of staked-in-needle pre-filled syringes: mechanism of liquid entering the needle and solidification process
De Bardi, M., Müller, R., Grünzweig, C., Mannes, D., Boillat, P., Rigollet, M., … Yang, K. (2018). On the needle clogging of staked-in-needle pre-filled syringes: mechanism of liquid entering the needle and solidification process. European Journal of Pharmaceutics and Biopharmaceutics, 128, 272-281. https://doi.org/10.1016/j.ejpb.2018.05.006
Detectors requirements for the ODIN beamline at ESS
Morgano, M., Lehmann, E., & Strobl, M. (2015). Detectors requirements for the ODIN beamline at ESS. In E. H. Lehmann, A. P. Kaestner, & D. Mannes (Eds.), Physics procedia: Vol. 69. Proceedings of the 10th world conference on neutron radiography (WCNR-10) Grindelwald, Switzerland October 5-10, 2014 (pp. 152-160). https://doi.org/10.1016/j.phpro.2015.07.022
Broadband X-ray full field microscopy at a superbend
Stampanoni, M., Marone, F., Mikuljan, G., Jefimovs, K., Trtik, P., Vila-Comamala, J., … Abela, R. (2009). Broadband X-ray full field microscopy at a superbend. In Journal of physics: conference series: Vol. 186. 9th international conference on X-ray microscopy (p. 012018 (3 pp.). https://doi.org/10.1088/1742-6596/186/1/012018