| On source identification and alteration of single diesel and wood smoke soot particles in the atmosphere; an X-ray microspectroscopy study
Vernooij, M. G. C., Mohr, M., Tzvetkov, G., Zelenay, V., Huthwelker, T., Kaegi, R., … Grobéty, B. (2009). On source identification and alteration of single diesel and wood smoke soot particles in the atmosphere; an X-ray microspectroscopy study. Environmental Science and Technology, 43(14), 5339-5344. https://doi.org/10.1021/es800773h |
| Advanced thin film technology for ultrahigh resolution X-ray microscopy
Vila-Comamala, J., Jefimovs, K., Raabe, J., Pilvi, T., Fink, R. H., Senoner, M., … David, C. (2009). Advanced thin film technology for ultrahigh resolution X-ray microscopy. Ultramicroscopy, 109(11), 1360-1364. https://doi.org/10.1016/j.ultramic.2009.07.005 |
| Advanced x-ray diffractive optics
Vila-Comamala, J., Jefimovs, K., Pilvi, T., Ritala, M., Sarkar, S. S., Solak, H. H., … David, C. (2009). Advanced x-ray diffractive optics. In Journal of physics: conference series: Vol. 186. 9th international conference on x-ray microscopy (p. 012078 (3 pp.). https://doi.org/10.1088/1742-6596/186/1/012078 |
| A quantitative study of PCBM diffusion during annealing of P3HT: PCBM blend films
Watts, B., Belcher, W. J., Thomsen, L., Ade, H., & Dastoor, P. C. (2009). A quantitative study of PCBM diffusion during annealing of P3HT: PCBM blend films. Macromolecules, 42(21), 8392-8397. https://doi.org/10.1021/ma901444u |
| Soft X-ray beam induced current technique
Watts, B., Queen, D., Kilcoyne, A. L. D., Tyliszczak, T., Hellman, F., & Ade, H. (2009). Soft X-ray beam induced current technique. In Journal of physics: conference series: Vol. 186. 9th international conference on x-ray microscopy (p. 012023 (3 pp.). https://doi.org/10.1088/1742-6596/186/1/012023 |
| Zircaloy-2 secondary phase precipitate analysis by X-ray microspectroscopy
Degueldre, C., Raabe, J., Kuri, G., & Abolhassani, S. (2008). Zircaloy-2 secondary phase precipitate analysis by X-ray microspectroscopy. Talanta, 75(2), 402-406. https://doi.org/10.1016/j.talanta.2007.11.052 |
| Quantitative analysis of scanning transmission X-ray microscopy images of gas-filled PVA based microballoons
Fernandes, P. A. L., Tzvetkov, G., Fink, R. H., Paradossi, G., & Fery, A. (2008). Quantitative analysis of scanning transmission X-ray microscopy images of gas-filled PVA based microballoons. Langmuir, 24(23), 13677-13682. https://doi.org/10.1021/la801898t |
| Large-scale synthesis of single-crystalline iron oxide magnetic nanorings
Jia, C. J., Sun, L. D., Luo, F., Han, X. D., Heyderman, L. J., Yan, Z. G., … Raabe, J. (2008). Large-scale synthesis of single-crystalline iron oxide magnetic nanorings. Journal of the American Chemical Society, 130(50), 16968-16977. https://doi.org/10.1021/ja805152t |
| PolLux: a new facility for soft x-ray spectromicroscopy at the Swiss Light Source
Raabe, J., Tzvetkov, G., Flechsig, U., Böge, M., Jaggi, A., Sarafimov, B., … Quitmann, C. (2008). PolLux: a new facility for soft x-ray spectromicroscopy at the Swiss Light Source. Review of Scientific Instruments, 79(11), 113704 (10 pp.). https://doi.org/10.1063/1.3021472 |
| <em>In situ </em>characterization of gas-filled microballoons using soft X-ray microspectroscopy
Tzvetkov, G., Graf, B., Fernandes, P., Fery, A., Cavalieri, F., Paradossi, G., & Fink, R. H. (2008). In situ characterization of gas-filled microballoons using soft X-ray microspectroscopy. Soft Matter, 4(3), 510-514. https://doi.org/10.1039/b715392a |
| Soft X-ray spectromicroscopy of phase-change microcapsules
Tzvetkov, G., Graf, B., Wiegner, R., Raabe, J., Quitmann, C., & Fink, R. (2008). Soft X-ray spectromicroscopy of phase-change microcapsules. Micron, 39(3), 275-279. https://doi.org/10.1016/j.micron.2007.04.002 |
| Temperature-dependent X-ray microspectroscopy of phase-change core-shell microcapsules
Tzvetkov, G., & Fink, R. H. (2008). Temperature-dependent X-ray microspectroscopy of phase-change core-shell microcapsules. Scripta Materialia, 59(3), 348-351. https://doi.org/10.1016/j.scriptamat.2008.04.002 |
| Silicon Fresnel zone plates for high heat load X-ray microscopy
Vila-Comamala, J., Jefimovs, K., Raabe, J., Kaulich, B., & David, C. (2008). Silicon Fresnel zone plates for high heat load X-ray microscopy. Microelectronic Engineering, 85(5-6), 1241-1244. https://doi.org/10.1016/j.mee.2008.01.023 |
