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The benefits of one-dimensional detectors for high-pressure powder X-ray diffraction
Fisch, M., Lanza, A., Macchi, P., & Casati, N. (2015). The benefits of one-dimensional detectors for high-pressure powder X-ray diffraction. Journal of Applied Crystallography, 48, 1956-1963. https://doi.org/10.1107/S1600576715020865
Exploiting texture to estimate the relative intensities of overlapping reflections
Baerlocher, C., McCusker, L. B., Prokic, S., & Wessels, T. (2004). Exploiting texture to estimate the relative intensities of overlapping reflections. Zeitschrift für Kristallographie: Crystalline Materials, 219(12), 803-812. https://doi.org/10.1524/zkri.219.12.803.55861