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A spatial beam property analyzer based on dispersive crystal diffraction for low-emittance X-ray light sources
Samadi, N., Shi, X., Ozkan Loch, C., Krempasky, J., Boege, M., Chapman, D., & Stampanoni, M. (2022). A spatial beam property analyzer based on dispersive crystal diffraction for low-emittance X-ray light sources. Scientific Reports, 12(1), 18267 (9 pp.). https://doi.org/10.1038/s41598-022-23004-3