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Silicon carbide X-ray beam position monitors for synchrotron applications
Nida, S., Tsibizov, A., Ziemann, T., Woerle, J., Moesch, A., Schulze-Briese, C., … Camarda, M. (2019). Silicon carbide X-ray beam position monitors for synchrotron applications. Journal of Synchrotron Radiation, 26(1), 28-35. https://doi.org/10.1107/S1600577518014248
High-resolution high-efficiency X-ray imaging system based on the in-line Bragg magnifier and the Medipix detector
Vagovič, P., Korytár, D., Cecilia, A., Hamann, E., Švéda, L., Pelliccia, D., … Baumbach, T. (2013). High-resolution high-efficiency X-ray imaging system based on the in-line Bragg magnifier and the Medipix detector. Journal of Synchrotron Radiation, 20(1), 153-159. https://doi.org/10.1107/S0909049512044366
The Materials Science beamline upgrade at the Swiss Light Source
Willmott, P. R., Meister, D., Leake, S. J., Lange, M., Bergamaschi, A., Böge, M., … Wullschleger, R. (2013). The Materials Science beamline upgrade at the Swiss Light Source. Journal of Synchrotron Radiation, 20(5), 667-682. https://doi.org/10.1107/S0909049513018475
Investigation of multilayer X-ray optics for the 6 keV to 20 keV energy range
Oberta, P., Platonov, Y., & Flechsig, U. (2012). Investigation of multilayer X-ray optics for the 6 keV to 20 keV energy range. Journal of Synchrotron Radiation, 19(5), 675-681. https://doi.org/10.1107/S0909049512032153
X-Treme beamline at SLS: X-ray magnetic circular and linear dichroism at high field and low temperature
Piamonteze, C., Flechsig, U., Rusponi, S., Dreiser, J., Heidler, J., Schmidt, M., … Nolting, F. (2012). X-Treme beamline at SLS: X-ray magnetic circular and linear dichroism at high field and low temperature. Journal of Synchrotron Radiation, 19(5), 661-674. https://doi.org/10.1107/S0909049512027847
High-resolution soft X-ray beamline ADRESS at the Swiss Light Source for resonant inelastic X-ray scattering and angle-resolved photoelectron spectroscopies
Strocov, V. N., Schmitt, T., Flechsig, U., Schmidt, T., Imhof, A., Chen, Q., … Patthey, L. (2010). High-resolution soft X-ray beamline ADRESS at the Swiss Light Source for resonant inelastic X-ray scattering and angle-resolved photoelectron spectroscopies. Journal of Synchrotron Radiation, 17(5), 631-643. https://doi.org/10.1107/S0909049510019862