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Soft x-ray microscopy with 7 nm resolution
Rösner, B., Finizio, S., Koch, F., Döring, F., Guzenko, V. A., Langer, M., … David, C. (2020). Soft x-ray microscopy with 7 nm resolution. Optica, 7(11), 1602-1608. https://doi.org/10.1364/OPTICA.399885
Diffractive X-ray optics for synchrotrons and free-electron lasers
David, C., Rösner, B., Döring, F., Guzenko, V., Koch, F., Lebugle, M., … Schroer, C. (2018). Diffractive X-ray optics for synchrotrons and free-electron lasers. Microscopy and Microanalysis, 24(Suppl. 2), 264-267. https://doi.org/10.1017/S1431927618013673
7 nm spatial resolution in soft X-ray microscopy
Rösner, B., Koch, F., Döring, F., Guzenko, V. A., Meyer, M., Ornelas, J. L., … David, C. (2018). 7 nm spatial resolution in soft X-ray microscopy. Microscopy and Microanalysis, 24(Suppl. 2), 270-271. https://doi.org/10.1017/S1431927618013697
Exploiting atomic layer deposition for fabricating sub-10 nm X-ray lenses
Rösner, B., Koch, F., Döring, F., Bosgra, J., Guzenko, V. A., Kirk, E., … David, C. (2018). Exploiting atomic layer deposition for fabricating sub-10 nm X-ray lenses. Microelectronic Engineering, 191, 91-96. https://doi.org/10.1016/j.mee.2018.01.033