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Post-irradiation examinations of SINQ Target-11
Dai, Y., Boutellier, V., Grabherr, R., Urech, A., Blau, B., Welte, J., … Wohlmuther, M. (2021). Post-irradiation examinations of SINQ Target-11. In K. Kikuchi (Ed.), Materials science forum: Vol. 1024. Spallation materials technology (pp. 41-52). https://doi.org/10.4028/www.scientific.net/MSF.1024.41
Ion implanted phosphorous for 4h-sic vdmosfets source regions: effect of the post implantation annealing time
Nipoti, R., Parisini, A., Boldrini, V., Vantaggio, S., Gorni, M., Canino, M., … Grossner, U. (2020). Ion implanted phosphorous for 4h-sic vdmosfets source regions: effect of the post implantation annealing time. H. Yano, T. Ohshima, K. Eto, S. Harada, T. Mitani, & Y. Tanaka (Eds.), Materials science forum: Vol. 1004. (pp. 698-704). Presented at the 18th international conference on silicon carbide and related materials 2019 (ICSCRM 2019). https://doi.org/10.4028/www.scientific.net/MSF.1004.698
Low-energy muons as a tool for a depth-resolved analysis of the SiO<sub>2</sub>/4H-SiC interface
Woerle, J., Prokscha, T., & Grossner, U. (2020). Low-energy muons as a tool for a depth-resolved analysis of the SiO2/4H-SiC interface. H. Yano, T. Ohshima, K. Eto, S. Harada, T. Mitani, & Y. Tanaka (Eds.), Materials science forum: Vol. 1004. (pp. 581-586). Presented at the 18th international conference on silicon carbide and related materials 2019 (ICSCRM 2019). https://doi.org/10.4028/www.scientific.net/MSF.1004.581
Surface morphology of 4H-SiC after thermal oxidation
Woerle, J., Šimonka, V., Müller, E., Hössinger, A., Sigg, H., Selberherr, S., … Grossner, U. (2019). Surface morphology of 4H-SiC after thermal oxidation. P. M. Gammon, V. A. Shah, R. A. McMahon, M. R. Jennings, O. Vavasour, F. Padfield, & P. A. Mawby (Eds.), Materials science forum: Vol. 963. (pp. 180-183). Presented at the 12th European conference on silicon carbide and related materials (ECSRM 2018). https://doi.org/10.4028/www.scientific.net/MSF.963.180
Analysis of 4H-SiC MOS capacitors on macro-stepped surfaces
Camarda, M., Woerle, J., Souliere, V., Ferro, G., Sigg, H., Grossner, U., & Gobrecht, J. (2017). Analysis of 4H-SiC MOS capacitors on macro-stepped surfaces. In K. Zekentes, K. V. Vasilevskiy, & N. Frangis (Eds.), Materials science forum: Vol. 897. Silicon carbide and related materials 2016 (pp. 107-110). https://doi.org/10.4028/www.scientific.net/MSF.897.107
Residual stress relief in the aluminium alloy 7075
Robinson, J. S., Truman, C. E., Pirling, T., & Panzner, T. (2017). Residual stress relief in the aluminium alloy 7075. T. Holden, T. Ungar, T. Buslaps, & T. Pirling (Eds.), Materials science forum: Vol. 905. (pp. 31-39). Presented at the 8th MECA-SENS. https://doi.org/10.4028/www.scientific.net/MSF.905.31
Analysis of thin thermal oxides on (0001) sic epitaxial layers
Woerle, J., Camarda, M., Schneider, C. W., Sigg, H., Grossner, U., & Gobrecht, J. (2017). Analysis of thin thermal oxides on (0001) sic epitaxial layers. In K. Zekentes, K. V. Vasilevskiy, & N. Frangis (Eds.), Materials science forum: Vol. 897. Silicon carbide and related materials 2016 (pp. 119-122). https://doi.org/10.4028/www.scientific.net/MSF.897.119
Junction Barrier Schottky (JBS) rectifier interface engineering facilitated by two-dimensional (2D) dopant imaging
Rossmann, H. R., Gysin, U., Bubendorf, A., Glatzel, T., Reshanov, S. A., Zhang, A., … Bartolf, H. (2016). Junction Barrier Schottky (JBS) rectifier interface engineering facilitated by two-dimensional (2D) dopant imaging. In F. Roccaforte, F. La Via, R. Nipoti, D. Crippa, F. Giannazzo, & M. Saggio (Eds.), Materials science forum: Vol. 858. Silicon carbide and related materials 2015 (pp. 497-500). https://doi.org/10.4028/www.scientific.net/MSF.858.497
Two-dimensional carrier profiling on lightly doped n-type 4H-SiC epitaxially grown layers
Rossmann, H. R., Gysin, U., Bubendorf, A., Glatzel, T., Reshanov, S., Schöner, A., … Bartolf, H. (2015). Two-dimensional carrier profiling on lightly doped n-type 4H-SiC epitaxially grown layers. Materials science forum: Vol. 821-823. (pp. 269-272). https://doi.org/10.4028/www.scientific.net/MSF.821-823.269
Through thickness residual stress measurements by neutron diffraction and hole drilling in a single laser-peened spot on a thin aluminium plate
Burak Toparli, M., & Fitzpatrick, M. E. (2014). Through thickness residual stress measurements by neutron diffraction and hole drilling in a single laser-peened spot on a thin aluminium plate. In Materials science forum: Vol. 772. MECHANICAL STRESS EVALUATION BY NEUTRONS AND SYNCHROTRON RADIATION VI (pp. 167-172). https://doi.org/10.4028/www.scientific.net/MSF.772.167
In-situ biaxial mechanical testing at the neutron time-of-flight diffractometer POLDI
Repper, J., Niffenegger, M., Van Petegem, S., Wagner, W., & Van Swygenhoven, H. (2014). In-situ biaxial mechanical testing at the neutron time-of-flight diffractometer POLDI. In Materials science forum: Vol. 768-769. INTERNATIONAL CONFERENCE ON RESIDUAL STRESSES 9 (ICRS 9) (pp. 60-65). https://doi.org/10.4028/www.scientific.net/MSF.768-769.60
Martensitic transformation of austenitic stainless steel cruciform geometry sample by biaxially fatigued cycling
Taran, Y. V., Balagurov, A. M., Venter, A. M., & Evans, A. (2014). Martensitic transformation of austenitic stainless steel cruciform geometry sample by biaxially fatigued cycling. In Materials science forum: Vol. 772. MECHANICAL STRESS EVALUATION BY NEUTRONS AND SYNCHROTRON RADIATION VI (pp. 109-115). https://doi.org/10.4028/www.scientific.net/MSF.772.109
Neutron diffraction investigation of residual stresses induced in niobium-steel bilayer pipe manufactured by explosive welding
Taran, Y., Balagurov, A., Sabirov, B., Davydov, V., & Venter, A. (2014). Neutron diffraction investigation of residual stresses induced in niobium-steel bilayer pipe manufactured by explosive welding. In Materials science forum: Vol. 768-769. INTERNATIONAL CONFERENCE ON RESIDUAL STRESSES 9 (ICRS 9) (pp. 697-704). https://doi.org/10.4028/www.scientific.net/MSF.768-769.697
Measurement of forming stresses in plain spherical bearings using neutron diffraction
Woodhead, J., Booker, J. D., Truman, C. E., & Davydov, V. (2014). Measurement of forming stresses in plain spherical bearings using neutron diffraction. In Materials science forum: Vol. 777. MECHANICAL STRESS EVALUATION BY NEUTRONS AND SYNCHROTRON RADIATION VII (pp. 58-64). https://doi.org/10.4028/www.scientific.net/MSF.777.58
Plasticity mechanisms in multi-scale copper-based nanocomposite wires
Thilly, L., Vidal, V., & Lecouturier, F. (2007). Plasticity mechanisms in multi-scale copper-based nanocomposite wires. In T. Chandra, K. Tsuzaki, M. Militzer, & C. Ravindran (Eds.), Materials science forum: Vol. 539-543. THERMEC 2006 (pp. 814-819). https://doi.org/10.4028/www.scientific.net/MSF.539-543.814
Magnetic neutron scattering from the rare-earth intermetallic compound system R<sub>3</sub>Pd<sub>20</sub>Si<sub>6</sub> (R = rare earth)
Herrmannsdörfer, T., Dönni, A., Fischer, P., Keller, L., Janssen, S., Furrer, A., … Kitazawa, H. (2004). Magnetic neutron scattering from the rare-earth intermetallic compound system R3Pd20Si6 (R = rare earth). In Y. Andersson, E. J. Mittemeijer, & U. Welzel (Eds.), Materials science forum: Vol. 443-444. European powder diffraction EPDIC 8 (pp. 233-238). https://doi.org/10.4028/www.scientific.net/MSF.443-444.233
Positron annihilation study of nanocrystalline Ni3Al: Simulations and measurements
Kuriplach, J., van Petegem, S., Hou, M., Zhurkin, E. E., van Swygenhoven, H., Dalla Torre, F., … Dauwe, C. (2001). Positron annihilation study of nanocrystalline Ni3Al: simulations and measurements. In W. Triftshäuser, G. Kögel, & P. Sperr (Eds.), Materials science forum: Vol. 363-365. Positron annihilation - ICPA-12 (pp. 94-96). https://doi.org/10.4028/www.scientific.net/MSF.363-365.94
Characterization of multilayers for neutron optics
Grimmer, H., Böni, P., Elsenhans, O., Friedli, H. P., Leifer, K., Buffat, P., & Anderson, I. S. (1994). Characterization of multilayers for neutron optics. In R. Delhez & E. J. Mittemeijer (Eds.), Materials science forum: Vol. 166-169. European powder diffraction 3 (pp. 279-286). https://doi.org/10.4028/www.scientific.net/MSF.166-169.279