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Tracking nickel oxide reduction in solid oxide cells via ex-situ ptychographic nano-tomography
De Angelis, S., Jørgensen, P. S., Tsai, E. H. R., Holler, M., Fevola, G., & Bowen, J. R. (2020). Tracking nickel oxide reduction in solid oxide cells via ex-situ ptychographic nano-tomography. Materials Characterization, 162, 110183 (5 pp.). https://doi.org/10.1016/j.matchar.2020.110183
A lathe system for micrometre-sized cylindrical sample preparation at room and cryogenic temperatures
Holler, M., Ihli, J., Tsai, E. H. R., Nudelman, F., Verezhak, M., van de Berg, W. D. J., & Shahmoradian, S. H. (2020). A lathe system for micrometre-sized cylindrical sample preparation at room and cryogenic temperatures. Journal of Synchrotron Radiation, 27(2), 472-476. https://doi.org/10.1107/S1600577519017028
LamNI - an instrument for X-ray scanning microscopy in laminography geometry
Holler, M., Odstrčil, M., Guizar-Sicairos, M., Lebugle, M., Frommherz, U., Lachat, T., … Aeppli, G. (2020). LamNI - an instrument for X-ray scanning microscopy in laminography geometry. Journal of Synchrotron Radiation, 27, 730-736. https://doi.org/10.1107/S1600577520003586
High resolution and uniform image reconstruction in a large field-of-view for EUV actinic mask review
Kim, H., Locans, U., Nebling, R., Dejkameh, A., Kazazis, D., Ekinci, Y., & Mochi, I. (2020). High resolution and uniform image reconstruction in a large field-of-view for EUV actinic mask review. In M. E. Preil (Ed.), Proceedings of SPIE: Vol. 11518. Photomask technology 2020 (p. 115180X (7 pp.). SPIE.
Unveiling 3D morphology of multiscale micro‐nanosilver sintering for advanced electronics manufacturing by ptychographic X‐ray nanotomography
Lin, Y. C., Liu, X., Chou, K. W., Tsai, E. H. R., Zhao, C., Holler, M., … Chen-Wiegart, Ychen K. (2020). Unveiling 3D morphology of multiscale micro‐nanosilver sintering for advanced electronics manufacturing by ptychographic X‐ray nanotomography. Advanced Engineering Materials, 22(4), 1901250 (8 pp.). https://doi.org/10.1002/adem.201901250
Illumination control in lensless imaging for EUV mask inspection and review
Mochi, I., Kim, H. S., Locans, U., Dejkameh, A., Nebling, R., Kazazis, D., & Ekinici, Y. (2020). Illumination control in lensless imaging for EUV mask inspection and review. In N. M. Felix & A. Lio (Eds.), Proceedings of SPIE: Vol. 11323. Extreme ultraviolet (EUV) lithography XI (p. 113231I (9 pp.). https://doi.org/10.1117/12.2552014
Effects of the illumination NA on EUV mask inspection with coherent diffraction imaging
Nebling, R., Kim, H. S., Locans, U., Dejkameh, A., Ekinci, Y., & Mochi, I. (2020). Effects of the illumination NA on EUV mask inspection with coherent diffraction imaging. In P. P. Naulleau, P. A. Gargini, T. Itani, & K. G. Ronse (Eds.), Proceedings of SPIE: Vol. 11517. Extreme Ultraviolet Lithography 2020 (p. 115170W (6 pp.). https://doi.org/10.1117/12.2573181
Pulse-to-pulse wavefront sensing at free-electron lasers using ptychography
Sala, S., Daurer, B. J., Odstrcil, M., Capotondi, F., Pedersoli, E., Hantke, M. F., … Maia, F. R. N. C. (2020). Pulse-to-pulse wavefront sensing at free-electron lasers using ptychography. Journal of Applied Crystallography, 53, 949-956. https://doi.org/10.1107/S1600576720006913
Hard X-ray wavefront correction via refractive phase plates made by additive and subtractive fabrication techniques
Seiboth, F., Brückner, D., Kahnt, M., Lyubomirskiy, M., Wittwer, F., Dzhigaev, D., … Schroer, C. G. (2020). Hard X-ray wavefront correction via refractive phase plates made by additive and subtractive fabrication techniques. Journal of Synchrotron Radiation, 27(5), 1121-1130. https://doi.org/10.1107/S1600577520007900
Alterations in sub-axonal architecture between normal aging and Parkinson's diseased human brains using label-free cryogenic X-ray nanotomography
Tran, H. T., Tsai, E. H. R., Lewis, A. J., Moors, T., Bol, J. G. J. M., Rostami, I., … Shahmoradian, S. H. (2020). Alterations in sub-axonal architecture between normal aging and Parkinson's diseased human brains using label-free cryogenic X-ray nanotomography. Frontiers in Neuroscience, 14, 570019 (22 pp.). https://doi.org/10.3389/fnins.2020.570019
<em>PtychoShelves</em>, a versatile high-level framework for high-performance analysis of ptychographic data
Wakonig, K., Stadler, H. C., Odstrčil, M., Tsai, E. H. R., Diaz, A., Holler, M., … Guizar-Sicairos, M. (2020). PtychoShelves, a versatile high-level framework for high-performance analysis of ptychographic data. Journal of Applied Crystallography, 53(2), 574-586. https://doi.org/10.1107/S1600576720001776
Resolution enhancement for lensless mask metrology with RESCAN
Mochi, I., Locans, U., Dejkameh, A., Nebling, R., Kazazis, D., Tseng, L. T., & Ekinci, Y. (2019). Resolution enhancement for lensless mask metrology with RESCAN. In T. Itani, P. A. Gargini, P. P. Naulleau, & K. G. Ronse (Eds.), Proceedings of SPIE: Vol. 11147. International conference on extreme ultraviolet lithography 2019 (p. 111471D (8 pp.). https://doi.org/10.1117/12.2537068
EUV reticle inspection using phase retrieval algorithms: a performance comparison
Nebling, R., Mochi, I., Kazazis, D., Locans, U., Dejkameh, A., & Ekinci, Y. (2019). EUV reticle inspection using phase retrieval algorithms: a performance comparison. In T. Itani, P. A. Gargini, P. P. Naulleau, & K. G. Ronse (Eds.), Proceedings of SPIE: Vol. 11147. International conference on extreme ultraviolet lithography 2019 (p. 111470R (7 pp.). https://doi.org/10.1117/12.2536936
Fast positioning for X-ray scanning microscopy by a combined motion of sample and beam-defining optics
Odstrcil, M., Lebugle, M., Lachat, T., Raabe, J., & Holler, M. (2019). Fast positioning for X-ray scanning microscopy by a combined motion of sample and beam-defining optics. Journal of Synchrotron Radiation, 26(2), 504-509. https://doi.org/10.1107/S160057751801785X
Ptychographic X-ray CT characterization of the osteocyte lacuno-canalicular network in a male rat's glucocorticoid induced osteoporosis model
Ciani, A., Toumi, H., Pallu, S., Tsai, E. H. R., Diaz, A., Guizar-Sicairos, M., … Kewish, C. M. (2018). Ptychographic X-ray CT characterization of the osteocyte lacuno-canalicular network in a male rat's glucocorticoid induced osteoporosis model. Bone Reports, 9, 122-131. https://doi.org/10.1016/j.bonr.2018.07.005
Three dimensional characterization of nickel coarsening in solid oxide cells via ex-situ ptychographic nano-tomography
De Angelis, S., Jørgensen, P. S., Tsai, E. H. R., Holler, M., Kreka, K., & Bowen, J. R. (2018). Three dimensional characterization of nickel coarsening in solid oxide cells via ex-situ ptychographic nano-tomography. Journal of Power Sources, 383, 72-79. https://doi.org/10.1016/j.jpowsour.2018.02.031
Correlative multiscale 3D imaging of a hierarchical nanoporous gold catalyst by electron, ion and X-ray nanotomography
Fam, Y., Sheppard, T. L., Diaz, A., Scherer, T., Holler, M., Wang, W., … Grunwaldt, J. D. (2018). Correlative multiscale 3D imaging of a hierarchical nanoporous gold catalyst by electron, ion and X-ray nanotomography. ChemCatChem, 10(13), 2858-2867. https://doi.org/10.1002/cctc.201800230
High resolution 3D imaging of integrated circuits by X-ray ptychography
Odstrcil, M., Holler, M., Raabe, J., & Guizar-Sicairos, M. (2018). High resolution 3D imaging of integrated circuits by X-ray ptychography. In N. K. Dhar & A. K. Dutta (Eds.), Proceedings of SPIE: Vol. 10656. Image sensing technologies: materials, devices, systems, and applications V (p. 106560U (8 pp.). https://doi.org/10.1117/12.2304835
Ex-situ tracking solid oxide cell electrode microstructural evolution in a redox cycle by high resolution ptychographic nanotomography
De Angelis, S., Jørgensen, P. S., Esposito, V., Tsai, E. H. R., Holler, M., Kreka, K., … Bowen, J. R. (2017). Ex-situ tracking solid oxide cell electrode microstructural evolution in a redox cycle by high resolution ptychographic nanotomography. Journal of Power Sources, 360, 520-527. https://doi.org/10.1016/j.jpowsour.2017.06.035
Coherent diffractive imaging methods for semiconductor manufacturing
Helfenstein, P., Mochi, I., Rajeev, R., Fernandez, S., & Ekinci, Y. (2017). Coherent diffractive imaging methods for semiconductor manufacturing. Advanced Optical Technologies, 6(6), 439-448. https://doi.org/10.1515/aot-2017-0052