| Recovery of spatial frequencies in coherent diffraction imaging in the presence of a central obscuration
Dejkameh, A., Nebling, R., Locans, U., Kim, H. S., Mochi, I., & Ekinci, Y. (2024). Recovery of spatial frequencies in coherent diffraction imaging in the presence of a central obscuration. Ultramicroscopy, 258, 113912 (8 pp.). https://doi.org/10.1016/j.ultramic.2023.113912 |
| 3D and multimodal X-ray microscopy reveals the impact of voids in CIGS solar cells
Fevola, G., Ossig, C., Verezhak, M., Garrevoet, J., Guthrey, H. L., Seyrich, M., … Stuckelberger, M. E. (2024). 3D and multimodal X-ray microscopy reveals the impact of voids in CIGS solar cells. Advanced Science, 11(2), 2301873 (8 pp.). https://doi.org/10.1002/advs.202301873 |
| New achievements in orbital angular momentum beam characterization using a Hartmann wavefront sensor and the Kirkpatrick–Baez active optical system KAOS
Novinec, L., Pancaldi, M., Capotondi, F., De Ninno, G., Guzzi, F., Kourousias, G., … Manfredda, M. (2024). New achievements in orbital angular momentum beam characterization using a Hartmann wavefront sensor and the Kirkpatrick–Baez active optical system KAOS. Journal of Synchrotron Radiation, 31(5), 1-9. https://doi.org/10.1107/S160057752400626X |
| Towards fast ptychography image reconstruction of EUV masks by deep neural networks
Ansuinelli, P., Béjar Haro, B., Ekinci, Y., & Mochi, I. (2023). Towards fast ptychography image reconstruction of EUV masks by deep neural networks. In T. Liang (Ed.), Proceedings of SPIE - the international society for optical rngineering: Vol. 12751. Photomask technology (p. 127510Q (10 pp.). https://doi.org/10.1117/12.2685227 |
| Environmental control for X-ray nanotomography
Holler, M., Aidukas, T., Heller, L., Appel, C., Phillips, N. W., Müller-Gubler, E., … Ihli, J. (2022). Environmental control for X-ray nanotomography. Journal of Synchrotron Radiation, 29, 1223-1231. https://doi.org/10.1107/S1600577522006968 |
| High-speed free-run ptychography at the Australian Synchrotron
Jones, M. W. M., van Riessen, G. A., Phillips, N. W., Schrank, C. E., Hinsley, G. N., Afshar, N., … Kewish, C. M. (2022). High-speed free-run ptychography at the Australian Synchrotron. Journal of Synchrotron Radiation, 29, 480-487. https://doi.org/10.1107/S1600577521012856 |
| Photon flux dependent image resolution of reflective ptychographic microscope for extreme ultraviolet actinic mask metrology
Kim, H. S., Nebling, R., Dejkameh, A., Shen, T., Ekinci, Y., & Mochi, I. (2022). Photon flux dependent image resolution of reflective ptychographic microscope for extreme ultraviolet actinic mask metrology. Journal of Micro/Nanopatterning, Materials, and Metrology, 21(3), 34002 (12 PP.). https://doi.org/10.1117/1.JMM.21.3.034002 |
| Hard X-ray wavefront engineering for aberration correction and beam shaping
Schroer, C. G., Seiboth, F., Schropp, A., Achilles, S., Seyrich, M., Patjens, S., … Gawlitza, P. (2022). Hard X-ray wavefront engineering for aberration correction and beam shaping. In A. M. Khounsary, H. Mimura, & C. Morawe (Eds.), Proceedings of SPIE: Vol. 12240. Advances in X-ray/EUV optics and components XVII (p. 122400J (8 pp.). https://doi.org/10.1117/12.2633458 |
| Resolution limit and photon flux dependency in EUV ptychography
Kim, H., Nebling, R., Dejkameh, A., Tao, S., Mochi, I., & Ekinci, Y. (2021). Resolution limit and photon flux dependency in EUV ptychography . In Kim, Nebling, Dejkameh, Tao, Iacopo, Yasin, & S. P. Renwick (Eds.), Proceedings of SPIE: Vol. 11855. Photomask technology 2021 (p. 1185506 (8 pp.). https://doi.org/10.1117/12.2601246 |
| A priori information in ptychographic image reconstruction for EUV mask metrology
Nebling, R., Mochi, I., Kim, Hsu, Dejkameh, A., Shen, T., & Ekinci, Y. (2021). A priori information in ptychographic image reconstruction for EUV mask metrology. In R. Nebling, I. Mochi, Hsu Kim, A. Dejkameh, T. Shen, Y. Ekinci, … A. Erdmann (Eds.), Proceedings of SPIE: Vol. 11875. Computational optics 2021 (p. 118750M (8 pp.). https://doi.org/10.1117/12.2600233 |
| Tracking nickel oxide reduction in solid oxide cells via ex-situ ptychographic nano-tomography
De Angelis, S., Jørgensen, P. S., Tsai, E. H. R., Holler, M., Fevola, G., & Bowen, J. R. (2020). Tracking nickel oxide reduction in solid oxide cells via ex-situ ptychographic nano-tomography. Materials Characterization, 162, 110183 (5 pp.). https://doi.org/10.1016/j.matchar.2020.110183 |
| A lathe system for micrometre-sized cylindrical sample preparation at room and cryogenic temperatures
Holler, M., Ihli, J., Tsai, E. H. R., Nudelman, F., Verezhak, M., van de Berg, W. D. J., & Shahmoradian, S. H. (2020). A lathe system for micrometre-sized cylindrical sample preparation at room and cryogenic temperatures. Journal of Synchrotron Radiation, 27(2), 472-476. https://doi.org/10.1107/S1600577519017028 |
| LamNI - an instrument for X-ray scanning microscopy in laminography geometry
Holler, M., Odstrčil, M., Guizar-Sicairos, M., Lebugle, M., Frommherz, U., Lachat, T., … Aeppli, G. (2020). LamNI - an instrument for X-ray scanning microscopy in laminography geometry. Journal of Synchrotron Radiation, 27, 730-736. https://doi.org/10.1107/S1600577520003586 |
| High resolution and uniform image reconstruction in a large field-of-view for EUV actinic mask review
Kim, H., Locans, U., Nebling, R., Dejkameh, A., Kazazis, D., Ekinci, Y., & Mochi, I. (2020). High resolution and uniform image reconstruction in a large field-of-view for EUV actinic mask review. In M. E. Preil (Ed.), Proceedings of SPIE: Vol. 11518. Photomask technology 2020 (p. 115180X (7 pp.). https://doi.org/10.1117/12.2573240 |
| Unveiling 3D morphology of multiscale micro‐nanosilver sintering for advanced electronics manufacturing by ptychographic X‐ray nanotomography
Lin, Y. C., Liu, X., Chou, K. W., Tsai, E. H. R., Zhao, C., Holler, M., … Chen-Wiegart, Ychen K. (2020). Unveiling 3D morphology of multiscale micro‐nanosilver sintering for advanced electronics manufacturing by ptychographic X‐ray nanotomography. Advanced Engineering Materials, 22(4), 1901250 (8 pp.). https://doi.org/10.1002/adem.201901250 |
| Illumination control in lensless imaging for EUV mask inspection and review
Mochi, I., Kim, H. S., Locans, U., Dejkameh, A., Nebling, R., Kazazis, D., & Ekinici, Y. (2020). Illumination control in lensless imaging for EUV mask inspection and review. In N. M. Felix & A. Lio (Eds.), Proceedings of SPIE: Vol. 11323. Extreme ultraviolet (EUV) lithography XI (p. 113231I (9 pp.). https://doi.org/10.1117/12.2552014 |
| Effects of the illumination NA on EUV mask inspection with coherent diffraction imaging
Nebling, R., Kim, H. S., Locans, U., Dejkameh, A., Ekinci, Y., & Mochi, I. (2020). Effects of the illumination NA on EUV mask inspection with coherent diffraction imaging. In P. P. Naulleau, P. A. Gargini, T. Itani, & K. G. Ronse (Eds.), Proceedings of SPIE: Vol. 11517. Extreme Ultraviolet Lithography 2020 (p. 115170W (6 pp.). https://doi.org/10.1117/12.2573181 |
| Pulse-to-pulse wavefront sensing at free-electron lasers using ptychography
Sala, S., Daurer, B. J., Odstrcil, M., Capotondi, F., Pedersoli, E., Hantke, M. F., … Maia, F. R. N. C. (2020). Pulse-to-pulse wavefront sensing at free-electron lasers using ptychography. Journal of Applied Crystallography, 53, 949-956. https://doi.org/10.1107/S1600576720006913 |
| Hard X-ray wavefront correction via refractive phase plates made by additive and subtractive fabrication techniques
Seiboth, F., Brückner, D., Kahnt, M., Lyubomirskiy, M., Wittwer, F., Dzhigaev, D., … Schroer, C. G. (2020). Hard X-ray wavefront correction via refractive phase plates made by additive and subtractive fabrication techniques. Journal of Synchrotron Radiation, 27(5), 1121-1130. https://doi.org/10.1107/S1600577520007900 |
| Alterations in sub-axonal architecture between normal aging and Parkinson's diseased human brains using label-free cryogenic X-ray nanotomography
Tran, H. T., Tsai, E. H. R., Lewis, A. J., Moors, T., Bol, J. G. J. M., Rostami, I., … Shahmoradian, S. H. (2020). Alterations in sub-axonal architecture between normal aging and Parkinson's diseased human brains using label-free cryogenic X-ray nanotomography. Frontiers in Neuroscience, 14, 570019 (22 pp.). https://doi.org/10.3389/fnins.2020.570019 |
