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<em>In situ</em> characterization of block copolymer ordering on chemically nanopatterned surfaces by time-resolved small angle x-ray scattering
Stuen, K. O., Liu, C., Welander, A. M., Liu, G., de Pablo, J. J., Nealey, P. F., … van der Veen, J. F. (2008). In situ characterization of block copolymer ordering on chemically nanopatterned surfaces by time-resolved small angle x-ray scattering. Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 26(6), 2504-2508. https://doi.org/10.1116/1.2991977
<em>In situ</em> contacting and current-injection into samples in photoemission electron microscopes
Heyne, L., Kläui, M., Rhensius, J., Le Guyader, L., & Nolting, F. (2010). In situ contacting and current-injection into samples in photoemission electron microscopes. Review of Scientific Instruments, 81(11), 113707 (5 pp.). https://doi.org/10.1063/1.3495967
<em>Photosensitized Chemically Amplified Resist<sup>TM</sup></em> (PSCAR<sup>TM</sup>) 2.0 for high throughput and high resolution EUV lithography: dual photosensitization of acid generation and quencher decomposition b
Nagahara, S., Carcasi, M., Shiraishi, G., Nakagawa, H., Dei, S., Shiozawa, T., … Tagawa, S. (2017). Photosensitized Chemically Amplified ResistTM (PSCARTM) 2.0 for high throughput and high resolution EUV lithography: dual photosensitization of acid generation and quencher decomposition by flood exposure. In C. K. Hohle (Ed.), Proceedings of SPIE: Vol. 10146. Advances in patterning materials and processes XXXIV (p. 101460G (14 pp.). https://doi.org/10.1117/12.2258217
<em>k</em>-space imaging of anisotropic 2D electron gas in GaN/GaAlN high-electron-mobility transistor heterostructures
Lev, L. L., Maiboroda, I. O., Husanu, M. A., Grichuk, E. S., Chumakov, N. K., Ezubchenko, I. S., … Strocov, V. N. (2018). k-space imaging of anisotropic 2D electron gas in GaN/GaAlN high-electron-mobility transistor heterostructures. Nature Communications, 9(1), 2653 (9 pp.). https://doi.org/10.1038/s41467-018-04354-x
1 kHz fixed-target serial crystallography using a multilayer monochromator and an integrating pixel detector
Tolstikova, A., Levantino, M., Yefanov, O., Hennicke, V., Fischer, P., Meyer, J., … Meents, A. (2019). 1 kHz fixed-target serial crystallography using a multilayer monochromator and an integrating pixel detector. IUCrJ, 6(5), 927-937. https://doi.org/10.1107/S205225251900914X
1.9% bi-axial tensile strain in thick germanium suspended membranes fabricated in optical germanium-on-insulator substrates for laser applications
Gassenq, A., Guilloy, K., Osvaldo Dias, G., Pauc, N., Rouchon, D., Hartmann, J. M., … Calvo, V. (2015). 1.9% bi-axial tensile strain in thick germanium suspended membranes fabricated in optical germanium-on-insulator substrates for laser applications. Applied Physics Letters, 107(19), 191904 (4 pp.). https://doi.org/10.1063/1.4935590
1D-full field microscopy of elastic and inelastic scattering with transmission off-axis fresnel zone plates
Döring, F., Marschall, F., Yin, Z., Rösner, B., Beye, M., Miedema, P., … David, C. (2018). 1D-full field microscopy of elastic and inelastic scattering with transmission off-axis fresnel zone plates. Microscopy and Microanalysis, 24(Suppl. 2), 182-183. https://doi.org/10.1017/S1431927618013260
20 nm line/space patterns in HSQ fabricated by EUV interference lithography
Ekinci, Y., Solak, H. H., Padeste, C., Gobrecht, J., Stoykovich, M. P., & Nealey, P. F. (2007). 20 nm line/space patterns in HSQ fabricated by EUV interference lithography. Microelectronic Engineering, 84(5-8), 700-704. https://doi.org/10.1016/j.mee.2007.01.213
2D grating simulation for X-ray phase-contrast and dark-field imaging with a Talbot interferometer
Zanette, I., David, C., Rutishauser, S., & Weitkamp, T. (2010). 2D grating simulation for X-ray phase-contrast and dark-field imaging with a Talbot interferometer. In M. Denecke & C. T. Walker (Eds.), AIP conference proceedings: Vol. 1221. X-ray optics and microanalsis: proceedings of the 20th international congress (pp. 73-79). https://doi.org/10.1063/1.3399260
3D Nanostructuring of hydrogen silsesquioxane resist by 100 keV electron beam lithography
Vila-Comamala, J., Gorelick, S., Guzenko, V. A., & David, C. (2011). 3D Nanostructuring of hydrogen silsesquioxane resist by 100 keV electron beam lithography. Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 29(6), 06F301 (5 pp.). https://doi.org/10.1116/1.3629811
3D SiGe quantum dot crystals: structural characterization and electronic coupling
Fromherz, T., Stangl, J., Lechner, R. T., Wintersberger, E., Bauer, G., Holy, V., … Grützmacher, D. (2009). 3D SiGe quantum dot crystals: structural characterization and electronic coupling. International Journal of Modern Physics B, 23(12-13), 2836-2841. https://doi.org/10.1142/S0217979209062414
3D visualization of mold filling stages in thermal nanoimprint by white light interferometry and atomic force microscopy
Schift, H., Kim, G., Lee, J., & Gobrecht, J. (2009). 3D visualization of mold filling stages in thermal nanoimprint by white light interferometry and atomic force microscopy. Nanotechnology, 20(35), 355301 (6 pp.). https://doi.org/10.1088/0957-4484/20/35/355301
4H-SiC(0001) surface faceting during interaction with liquid Si
Soulière, V., Carole, D., Camarda, M., Wörle, J., Grossner, U., Dezellus, O., & Ferro, G. (2016). 4H-SiC(0001) surface faceting during interaction with liquid Si. In F. Roccaforte, F. La Via, R. Nipoti, D. Crippa, F. Giannazzo, & M. Saggio (Eds.), Materials science forum: Vol. 858. Silicon carbide and related materials 2015. Selected, peer reviewed papers from the 16th international conference on silicon carbide and related materials, October 4-9, 2015, Giardini Naxos, Italy (pp. 163-166). https://doi.org/10.4028/www.scientific.net/MSF.858.163
7 nm spatial resolution in soft X-ray microscopy
Rösner, B., Koch, F., Döring, F., Guzenko, V. A., Meyer, M., Ornelas, J. L., … David, C. (2018). 7 nm spatial resolution in soft X-ray microscopy. Microscopy and Microanalysis, 24(Suppl. 2), 270-271. https://doi.org/10.1017/S1431927618013697
7 Å resolution in protein two-dimensional-crystal X-ray diffraction at Linac Coherent Light Source
Pedrini, B., Tsai, C. J., Capitani, G., Padeste, C., Hunter, M. S., Zatsepin, N. A., … Li, X. D. (2014). 7 Å resolution in protein two-dimensional-crystal X-ray diffraction at Linac Coherent Light Source. Philosophical Transactions of the Royal Society B: Biological Sciences, 369(1647), 20130500 (5 pp.). https://doi.org/10.1098/rstb.2013.0500
<em>Colloquium:</em> nonthermal pathways to ultrafast control in quantum materials
de la Torre, A., Kennes, D. M., Claassen, M., Gerber, S., McIver, J. W., & Sentef, M. A. (2021). Colloquium: nonthermal pathways to ultrafast control in quantum materials. Reviews of Modern Physics, 93(4), 041002 (31 pp.). https://doi.org/10.1103/RevModPhys.93.041002
<em>In situ</em> electrochemical STM study of platinum nanodot arrays on highly oriented pyrolythic graphite prepared by electron beam lithography
Foelske-Schmitz, A., Peitz, A., Guzenko, V. A., Weingarth, D., Scherer, G. G., Wokaun, A., & Kötz, R. (2012). In situ electrochemical STM study of platinum nanodot arrays on highly oriented pyrolythic graphite prepared by electron beam lithography. Surface Science, 606(23-24), 1922-1933. https://doi.org/10.1016/j.susc.2012.07.040
<em>In situ</em> investigations of Si and Ge interdiffusion in Ge-rich Si/SiGe multilayers using x-ray scattering
Meduňa, M., Novák, J., Bauer, G., Holý, V., Falub, C. V., Tsujino, S., & Grützmacher, D. (2007). In situ investigations of Si and Ge interdiffusion in Ge-rich Si/SiGe multilayers using x-ray scattering. Semiconductor Science and Technology, 22(4), 447-453. https://doi.org/10.1088/0268-1242/22/4/026
A CVD diamond based X-ray beam profile sensor combined with the Gotthard charge integrating readout
Pradervand, C., Bednarzik, M., Schmitt, B., Mozzanica, A., & Schulze-Briese, C. (2012). A CVD diamond based X-ray beam profile sensor combined with the Gotthard charge integrating readout. Presented at the 11th International conference on synchrotron radiation instrumentation (SRI2012). Lyon, France.
A Verilog-A model for silicon nanowire biosensors: from theory to verification
Livi, P., Bedner, K., Tarasov, A., Wipf, M., Chen, Y., Schon̈enberger, C., & Hierlemann, A. (2013). A Verilog-A model for silicon nanowire biosensors: from theory to verification. Sensors and Actuators B: Chemical, 179, 293-300. https://doi.org/10.1016/j.snb.2012.09.026
 

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